Masterclass Certificate in Data-Driven IC Testing
-- ViewingNowThe Masterclass Certificate in Data-Driven IC Testing is a comprehensive course designed to equip learners with essential skills for career advancement in the semiconductor industry. This course focuses on the importance of data-driven testing methodologies in ensuring the reliability and functionality of Integrated Circuits (ICs).
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โข Data-Driven IC Testing Methodologies
โข Understanding Digital and Mixed-Signal Test Techniques
โข Design for Testability (DFT) Principles and Implementations
โข Advanced IC Test Algorithms and Diagnostics
โข Semiconductor Test Equipment and Architectures
โข Statistical Analysis and Yield Improvement Strategies
โข SOC Test and Test Compression Techniques
โข Data Analysis and Visualization Tools for IC Testing
โข Emerging Trends in Data-Driven IC Testing
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