Professional Certificate in Semiconductor Failure Analysis for Advanced Packaging
-- ViewingNowThe Professional Certificate in Semiconductor Failure Analysis for Advanced Packaging is a comprehensive course designed to equip learners with critical skills necessary to diagnose and solve complex issues in semiconductor manufacturing. The course highlights the importance of failure analysis, a crucial process in ensuring product quality and reliability in the semiconductor industry.
4,848+
Students enrolled
GBP £ 140
GBP £ 202
Save 44% with our special offer
ๅ ณไบ่ฟ้จ่ฏพ็จ
100%ๅจ็บฟ
้ๆถ้ๅฐๅญฆไน
ๅฏๅไบซ็่ฏไนฆ
ๆทปๅ ๅฐๆจ็LinkedInไธชไบบ่ตๆ
2ไธชๆๅฎๆ
ๆฏๅจ2-3ๅฐๆถ
้ๆถๅผๅง
ๆ ็ญๅพ ๆ
่ฏพ็จ่ฏฆๆ
โข Introduction to Semiconductor Failure Analysis: Basics of semiconductor components, common failure modes, and the importance of failure analysis. โข Advanced Packaging Technologies: Advanced packaging techniques, materials, and processes used in semiconductor manufacturing. โข Failure Analysis Methodologies: Overview of various failure analysis techniques, such as visual inspection, electrical testing, and chemical analysis. โข Fault Isolation Techniques: Techniques used to isolate and identify the root cause of a failure in semiconductor devices, including electrical and physical analysis methods. โข Materials Characterization: Methods and tools used to characterize materials used in semiconductor packaging, including microscopy, spectroscopy, and diffraction techniques. โข Reliability Testing and Analysis: Understanding reliability testing methods and analysis techniques, including accelerated life testing, stress testing, and statistical analysis. โข Design of Experiments (DOE): Principles and applications of DOE in semiconductor failure analysis, including factorial design, response surface methodology, and statistical analysis. โข Data Analysis and Visualization: Techniques and tools used to analyze and visualize semiconductor failure data, including data mining, machine learning, and data visualization techniques. โข Case Studies in Semiconductor Failure Analysis: Analysis of real-world case studies to demonstrate the practical application of failure analysis techniques and methodologies.
่ไธ้่ทฏ
ๅ ฅๅญฆ่ฆๆฑ
- ๅฏนไธป้ข็ๅบๆฌ็่งฃ
- ่ฑ่ฏญ่ฏญ่จ่ฝๅ
- ่ฎก็ฎๆบๅไบ่็ฝ่ฎฟ้ฎ
- ๅบๆฌ่ฎก็ฎๆบๆ่ฝ
- ๅฎๆ่ฏพ็จ็ๅฅ็ฎ็ฒพ็ฅ
ๆ ้ไบๅ ็ๆญฃๅผ่ตๆ ผใ่ฏพ็จ่ฎพ่ฎกๆณจ้ๅฏ่ฎฟ้ฎๆงใ
่ฏพ็จ็ถๆ
ๆฌ่ฏพ็จไธบ่ไธๅๅฑๆไพๅฎ็จ็็ฅ่ฏๅๆ่ฝใๅฎๆฏ๏ผ
- ๆช็ป่ฎคๅฏๆบๆ่ฎค่ฏ
- ๆช็ปๆๆๆบๆ็็ฎก
- ๅฏนๆญฃๅผ่ตๆ ผ็่กฅๅ
ๆๅๅฎๆ่ฏพ็จๅ๏ผๆจๅฐ่ทๅพ็ปไธ่ฏไนฆใ
ไธบไปไนไบบไปฌ้ๆฉๆไปฌไฝไธบ่ไธๅๅฑ
ๆญฃๅจๅ ่ฝฝ่ฏ่ฎบ...
ๅธธ่ง้ฎ้ข
่ฏพ็จ่ดน็จ
- ๆฏๅจ3-4ๅฐๆถ
- ๆๅ่ฏไนฆไบคไป
- ๅผๆพๆณจๅ - ้ๆถๅผๅง
- ๆฏๅจ2-3ๅฐๆถ
- ๅธธ่ง่ฏไนฆไบคไป
- ๅผๆพๆณจๅ - ้ๆถๅผๅง
- ๅฎๆด่ฏพ็จ่ฎฟ้ฎ
- ๆฐๅญ่ฏไนฆ
- ่ฏพ็จๆๆ
่ทๅ่ฏพ็จไฟกๆฏ
่ทๅพ่ไธ่ฏไนฆ