Professional Certificate in Connected IC Test Systems
-- ViewingNowThe Professional Certificate in Connected IC Test Systems is a comprehensive course designed to equip learners with critical skills for the rapidly evolving semiconductor industry. This program emphasizes the importance of testing in the integrated circuit (IC) design process, bridging the gap between IC design and high-volume manufacturing.
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โข IC Test Engineering Fundamentals: Introduction to IC testing, test methods, and quality assurance.
โข Test Architectures and Methodologies: Overview of connected IC test systems, digital and mixed-signal testing, and advanced test techniques.
โข Design for Test (DFT) Strategies: Exploring DFT concepts, scan testing, built-in self-test (BIST), and test pattern generation.
โข Automated Test Program Development (ATPD): Hands-on experience with ATPD tools, test pattern compression, and debugging techniques.
โข Semiconductor Test Equipment: Understanding various test equipment, interfaces, and data analysis tools.
โข Test Compression Techniques: In-depth look at test compression methods, including decompression architectures and run-time compression.
โข High-Speed Serial Link Testing: Best practices for high-speed serial link testing, equalization, and signal integrity analysis.
โข Statistical Analysis and Yield Optimization: Learning statistical analysis techniques, yield modeling, and reliability assessment.
โข Advanced Connected IC Test Systems: Hands-on experience with advanced test systems, including handling big data and machine learning applications.
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