Professional Certificate in Connected IC Test Systems

-- ViewingNow

The Professional Certificate in Connected IC Test Systems is a comprehensive course designed to equip learners with critical skills for the rapidly evolving semiconductor industry. This program emphasizes the importance of testing in the integrated circuit (IC) design process, bridging the gap between IC design and high-volume manufacturing.

4,0
Based on 2.055 reviews

4.505+

Students enrolled

GBP £ 140

GBP £ 202

Save 44% with our special offer

Start Now

AboutThisCourse

With the increasing complexity of ICs, there's a growing industry demand for professionals with a deep understanding of test systems and methodologies. By enrolling in this course, learners will gain expertise in areas such as digital, analog, and mixed-signal testing, along with an understanding of semiconductor manufacturing and test automation. These skills are essential for career advancement in semiconductor companies, test and measurement instrument vendors, and IC design houses. By completing this program, learners will demonstrate their ability to contribute effectively in this competitive field and stay updated on the latest industry trends.

HundredPercentOnline

LearnFromAnywhere

ShareableCertificate

AddToLinkedIn

TwoMonthsToComplete

AtTwoThreeHoursAWeek

StartAnytime

NoWaitingPeriod

CourseDetails

• IC Test Engineering Fundamentals: Introduction to IC testing, test methods, and quality assurance.
• Test Architectures and Methodologies: Overview of connected IC test systems, digital and mixed-signal testing, and advanced test techniques.
• Design for Test (DFT) Strategies: Exploring DFT concepts, scan testing, built-in self-test (BIST), and test pattern generation.
• Automated Test Program Development (ATPD): Hands-on experience with ATPD tools, test pattern compression, and debugging techniques.
• Semiconductor Test Equipment: Understanding various test equipment, interfaces, and data analysis tools.
• Test Compression Techniques: In-depth look at test compression methods, including decompression architectures and run-time compression.
• High-Speed Serial Link Testing: Best practices for high-speed serial link testing, equalization, and signal integrity analysis.
• Statistical Analysis and Yield Optimization: Learning statistical analysis techniques, yield modeling, and reliability assessment.
• Advanced Connected IC Test Systems: Hands-on experience with advanced test systems, including handling big data and machine learning applications.

CareerPath

EntryRequirements

  • BasicUnderstandingSubject
  • ProficiencyEnglish
  • ComputerInternetAccess
  • BasicComputerSkills
  • DedicationCompleteCourse

NoPriorQualifications

CourseStatus

CourseProvidesPractical

  • NotAccreditedRecognized
  • NotRegulatedAuthorized
  • ComplementaryFormalQualifications

ReceiveCertificateCompletion

WhyPeopleChooseUs

LoadingReviews

FrequentlyAskedQuestions

WhatMakesCourseUnique

▼

HowLongCompleteCourse

▼

WhatSupportWillIReceive

▼

IsCertificateRecognized

▼

WhatCareerOpportunities

▼

WhenCanIStartCourse

▼

WhatIsCourseFormat

▼

CourseFee

MostPopular
FastTrack GBP £140
CompleteInOneMonth
AcceleratedLearningPath
  • ThreeFourHoursPerWeek
  • EarlyCertificateDelivery
  • OpenEnrollmentStartAnytime
Start Now
StandardMode GBP £90
CompleteInTwoMonths
FlexibleLearningPace
  • TwoThreeHoursPerWeek
  • RegularCertificateDelivery
  • OpenEnrollmentStartAnytime
Start Now
WhatsIncludedBothPlans
  • FullCourseAccess
  • DigitalCertificate
  • CourseMaterials
AllInclusivePricing

GetCourseInformation

WellSendDetailedInformation

PayAsCompany

RequestInvoiceCompany

PayByInvoice

EarnCareerCertificate

SampleCertificateBackground
PROFESSIONAL CERTIFICATE IN CONNECTED IC TEST SYSTEMS
IsAwardedTo
LearnerName
WhoHasCompletedProgramme
London School of International Business (LSIB)
AwardedOn
05 May 2025
BlockchainId s-1-a-2-m-3-p-4-l-5-e
AddCredentialToProfile
SSB Logo

4.8
Nova Inscrição
→ Ver Curso